We have compiled a list of manufacturers, distributors, product information, reference prices, and rankings for Defect Inspection Equipment.
ipros is IPROS GMS ・ IPROS One of the largest technical database sites in Japan that collects information on.

Defect Inspection Equipment Product List and Ranking from 22 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated： Aggregation Period:Oct 07, 2026～Nov 03, 2026
This ranking is based on the number of page views on our site.

Defect Inspection Equipment Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Oct 07, 2026～Nov 03, 2026
This ranking is based on the number of page views on our site.

  1. AYAHA ENGINEERING CO.,LTD. Head office Shiga//Testing, Analysis and Measurement
  2. 三明 Shizuoka//Industrial Electrical Equipment
  3. クボタ計装 Osaka//Testing, Analysis and Measurement
  4. 4 オプティマ https://www.optima-1.co.jp/ Kanagawa//Trading company/Wholesale
  5. 5 アローズエンジニアリング Chiba//Testing, Analysis and Measurement
Go to Company Ranking

Defect Inspection Equipment Product ranking

Last Updated： Aggregation Period:Oct 07, 2026～Nov 03, 2026
This ranking is based on the number of page views on our site.

  1. Offline inspection device "MICRO ACE series" AYAHA ENGINEERING CO.,LTD. Head office
  2. Murabiyuwaa 三明
  3. Inline inspection device "CONTACT ACE series" AYAHA ENGINEERING CO.,LTD. Head office
  4. 4 AR film defect inspection device 'EX2001S' アローズエンジニアリング
  5. 4 Edge Defect Inspection Device "RXW Series" オプティマ https://www.optima-1.co.jp/

Defect Inspection Equipment Product List

1～30 item / All 31 items

Displayed results
For inspecting surface scratches, foreign objects, and defects! Fine defect inspection equipment.

For inspecting surface scratches, foreign objects, and defects! Fine defect inspection equipment.

With an optical resolution of "1.8μm," it enables very high-precision inspections. It can also accommodate dimensional measurements and inspect two-dimensional punched products, among others.

This is a two-dimensional inspection device using a high-resolution camera and a high-precision X-Y stage. It is suitable for inspecting surface scratches and foreign objects on optical films, sheets, and touch panels, as well as for defect inspection. With an optical resolution of "1.8μm," it enables very high-precision inspections. It can also accommodate dimensional measurements and inspect two-dimensional punched products. 【Features】 - Automatically saves inspection data and images - Camera pixel count: 9 million pixels - High optical resolution (1.8μm) allows for clear viewing of fine inspection areas - Ideal for inspecting peripheral electrodes of touch panels and disconnections or short circuits in fine wiring of printed circuit boards *For more details, please download the materials or contact us.

  • Defect Inspection Equipment
  • Flaw detection testing
  • Circuit Board Inspection Equipment
  • Defect Inspection Equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Collaborative Project Product Series

Collaborative Project Product Series

Your expertise" × "Our technological capabilities" to realize "the one machine you were looking for!

At Ayaha Engineering, we are developing new products using our technical expertise and your specialized knowledge as part of our "Collaborative Planning Product Series" to meet a wide variety of requests regarding defect detection. From film, sheet, and web inspection to non-woven fabric, electrode sheets, copper plates, steel plates, and metal foil inspection, we propose various defect inspection devices, surface inspection devices, and marking devices tailored to your product size, processing line, and detected defects. We are fully committed to tackling special workpieces and unprecedented inspection methods to realize your desire for "a machine like this!" 【We can meet the following requests!】 ■ I want a fiber inspection machine or a fabric inspection machine ■ I want to perform color inspection ■ I want to systematize unique inspection know-how ■ Complex devices are difficult to use ■ I want to conduct research using diverse algorithms *For more details, please contact us.

  • Other inspection equipment and devices
  • Defect Inspection Equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Inline inspection device "CONTACT ACE series"

Inline inspection device "CONTACT ACE series"

Automatic mask setting at slit positions! A close-up surface defect inspection device that reduces inspection labor!

The "CONTACT ACE Series" is an inline inspection device compatible with both reflective and transmissive optical systems. The product in the same series, "CONTACT FILM," is a close-up surface defect inspection device that can automatically set mask positions (up to 48 locations) at the slit using dedicated software. This significantly reduces the effort required for inspection. By adopting a CIS (Contact Image Sensor), it does not use optical lenses, eliminating the influence of lens aberration at the edges and center of the field of view. 【Features (CONTACT FILM)】 ■ Designed for the film and coating industry ■ Space-saving compared to conventional cameras due to close-up imaging ■ Ideal for inspection just before winding and in narrow spaces after separation ■ Stable inspection across the entire field of view without being affected by lens aberration ■ Capable of inspecting a width of approximately 2000mm with a single camera *For more details, please refer to the PDF document or feel free to contact us.

  • Other inspection equipment and devices
  • Defect Inspection Equipment
  • Defect Inspection Equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Internal defect inspection device

Internal defect inspection device

Glass, quartz, crystal, etc.! An internal defect inspection device that visualizes internal defects in transparent materials.

The "Internal Defect Inspection Device" observes internal defects in transparent materials and liquids using laser light and a special optical system, detecting defects with dedicated image processing software. The maximum size is 2000×2000×500 (height) mm, and the defect detection capability ranges from 1μm (with a dedicated lens) to several mm. Additionally, defect inspection of parts that have been precisely processed after cutting transparent materials is possible with a super wide-field laser scanning imager. 【Features】 ■ Detects defects using laser sheet light with a dedicated optical lens system ■ Maximum size is 2000×2000×500 (height) mm ■ Defect detection capability ranges from 1μm (with a dedicated lens) to several mm ■ Available shapes include cylindrical and rectangular, accommodating both large and small items *For more details, please refer to the PDF document or feel free to contact us.

  • Defect Inspection Equipment
  • Defect Inspection Equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Fully Automatic Defect Inspection Device for MEMS 'IR-MEMS100'

Fully Automatic Defect Inspection Device for MEMS 'IR-MEMS100'

Detecting hard-to-find defects using processing to make low-contrast images easier to see.

The "IR-MEMS100" is a fully automated MEMS defect inspection device that automatically transports bonded wafers using robots, captures images of the internal state of the wafers with a specialized infrared optical system, and detects various defects using a defect detection algorithm. Images are captured with a high-sensitivity infrared camera set in an infrared microscope, and a proprietary defect detection software identifies hard-to-see defect areas. 【Features】 ■ Captures images with a high-sensitivity infrared camera set in an infrared microscope and detects hard-to-see defect areas using proprietary defect detection software. ■ Uses processing (effect processing) to enhance low-contrast images, making it easier to detect hard-to-find defect areas. ■ Compatible wafer sizes are 4 inches, 6 inches, and 8 inches. ■ Defect detection capability is approximately 10μm. ■ Inspection time is 30 minutes per wafer. *For more details, please refer to the PDF document or feel free to contact us.

  • Other inspection equipment and devices
  • Defect Inspection Equipment
  • Defect Inspection Equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Crystal Defect Inspection Device "EnVision"

Crystal Defect Inspection Device "EnVision"

Non-destructive/non-contact! Detection and monitoring of expansion defects inside wafers at the nm scale is possible.

"En-Vison" is a crystal defect inspection device that can non-contact and non-destructively measure and evaluate crystal defects within wafers, such as dislocation defects, oxygen precipitates, and stacking faults. It provides a high dynamic range for both defect size (15nm to sub-micron) and density (E6 to E10/cm3). By significantly improving detection sensitivity in the depth direction of the wafer and covering a wide range of densities and applications, it greatly enhances the detection sensitivity of stress-induced dislocation defects in the depth direction, which cannot be confirmed near the surface, compared to conventional methods. 【Features】 ■ Non-destructive / Non-contact ■ Visualizes defects that cannot be confirmed by conventional inspection devices ■ Target area: Active device area (near the surface) ■ Detection in raw silicon and at the depth of active devices ■ No specialized knowledge required *For more details, please refer to the related link page or feel free to contact us.

  • Semiconductor inspection/test equipment
  • Other inspection equipment and devices
  • Defect Inspection Equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
AR film defect inspection device 'EX2001S'

AR film defect inspection device 'EX2001S'

Equipped with horizontal FFU! High-speed clean inspection possible! Compact design AR film defect inspection device.

At Arrows Engineering, we handle the AR film defect inspection equipment manufactured by IT Tech. The 'EX2001S' is a defect inspection machine for anti-reflective films on glass substrates. It performs high-speed scan inspections of the surfaces and backs of transparent substrates using an inverted microscope and line camera to detect defects. 【Features and Functions】 - The maximum substrate size is 400mm, with auto-focus inspection for transparent substrates. - Detected defects include white foreign matter (gaps) and black foreign matter on the AR film substrate. - Minimum detection resolution is 2.8μm (1.4μm). - Review inspections can be remotely controlled (camera/lighting/objective magnification/stage and focus). *For more details, please refer to the PDF document or feel free to contact us.

  • Other inspection equipment and devices
  • Defect Inspection Equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Hard Disk Surface Defect Inspection Device - Laser Explorer

Hard Disk Surface Defect Inspection Device - Laser Explorer

Detecting fine surface defects such as scratches and pits on the surface of hard disks.

By irradiating the surface of the hard disk with a high-power laser, fine surface defects such as scratches and pits are detected, classified by defect type, and the results are displayed. Not only does simultaneous irradiation with multiple lasers allow for high-sensitivity detection of scratches, but it also determines the uneven shapes of the defects. Features: - Detection of micro defects using high-power lasers - High scratch detection capability - Discrimination of defect unevenness - Full auto-focus - Excellent cost performance - Customization support - Automatic inspection for one cassette - Compatible with transparent glass substrates

  • others
  • Defect Inspection Equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Laser-type wafer surface defect inspection device - Laser Explorer

Laser-type wafer surface defect inspection device - Laser Explorer

Transparent wafers also undergo high-speed inspection! High-output lasers detect tiny scratches and particles!

The "Laser Explorer" is the latest wafer surface defect inspection device that also supports transparent wafers. A high-power laser detects minute defects such as scratches, pits, and particles! It can be utilized for shipping and receiving inspections of wafers, as well as for quality control in the epitaxial process! 【Other Features】 ■ High throughput (inspects 25 wafers in a cassette in about 40 minutes) ■ Discriminates the unevenness of defects ■ Automatic focusing for all samples ■ Customizable options ■ Supports automatic inspection of one cassette ■ High-precision marking for defects (optional) ■ Defect review using a laser microscope (optional)

  • Defect Inspection Equipment
  • Visual Inspection Equipment
  • Circuit Board Inspection Equipment
  • Defect Inspection Equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Defect Inspection Device "New Wire Inspector"

Defect Inspection Device "New Wire Inspector"

Space-saving, high-speed, high-precision, low-cost! Defect inspection device suitable for small-diameter pipes and more.

The "New Wire Inspector" is an appearance inspection and defect detection device that targets the surfaces of ultra-thin catheters and similar items at high speeds. It can detect surface defects on φ0.1 wire and V-groove depth defects of 10μm on φ2 wire, enabling the detection of defects that were previously impossible with existing technology. This inspection device is recommended for those considering moving away from visual inspections. 【Features】 ■ Capable of detecting surface defects on φ0.1 wire ■ Can detect V-groove depth defects of 10μm on φ2 wire ■ Can detect even when materials are vibrating ■ Capable of 360-degree inspection with a single unit ■ Not limited by material type ■ Fastest inspection speed of 20m/min (full circumference) *For more details, please refer to the PDF document or feel free to contact us.

  • Visual Inspection Equipment
  • Defect Inspection Equipment
  • Defect Inspection Equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Wafer Surface Defect Inspection Device "MO-601HS"

Wafer Surface Defect Inspection Device "MO-601HS"

Fully automatic measurement with an auto-loader! Wafer surface defect inspection equipment.

The "MO-601HS" is a wafer surface defect inspection device that enables measurement across the entire wafer, allowing for the identification of crystal defects near the active layer of Si wafers as foreign substances and surface roughness or scratches on the surface. It is possible to confirm defects with actual images through the viewer function, as well as analyze defects through TEM observation using the laser marking function. As a method for non-destructive evaluation of the breakdown voltage and reliability of oxide films, it is utilized for maintaining the quality of annealed wafers and others. 【Features】 ■ Fully automated measurement with an auto-loader ■ Compatible with 200mm and 300mm wafers ■ High sensitivity: capable of detecting defects as small as 200nm in diameter ■ Full mapping measurement function for defects, foreign substances, and haze ■ Raster scan method with constant measurement conditions *For more details, please refer to the catalog or feel free to contact us.

  • Other inspection equipment and devices
  • Defect Inspection Equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
[To those in the third industry] Quality inspection device for plain surfaces 'Mujiken-Ex'

[To those in the third industry] Quality inspection device for plain surfaces 'Mujiken-Ex'

Don't overlook any shortcomings even on high-speed lines! This product is a must-see for anyone involved in the production lines of the three-product industry!

"Mujiken-Ex" is a system that inspects surface defects (such as scratches, dirt, and foreign objects) on plain materials like film, paper, and metal, which are transported at high speeds in various production and processing environments. It is also suitable for inspecting materials used for containers, packaging, and labels in cosmetics and pharmaceuticals. If the material is in a web (sheet) form, it can inspect a wide variety of products without selecting the measured object or substrate. By hardware (board) implementing a self-developed high-speed processing circuit dedicated to inspection, it achieves approximately twice the image processing of standard machines while maintaining a high level of accuracy in appearance inspection. 【Features】 ■ Image Processing: High-speed image processing capabilities with a rich set of algorithms ■ Optical System: High-speed compatible cameras. Long-distance and high-speed communication support ■ Diverse system configurations *For more details, please refer to the PDF materials or feel free to contact us.

  • Other inspection equipment and devices
  • Defect Inspection Equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Appearance defect inspection machine

Appearance defect inspection machine

L1800 color general-purpose machine - featuring models like the eight-sided machine and E3000 color-specific type! Introducing a rich lineup.

We would like to introduce the "Appearance Defect Inspection Machine" that we handle. It features dedicated software specifically designed for fixed-shape inspection objects, allowing for easy and quick material change settings, such as the "E3000 Color Dedicated Type," and the "E8000 Color Compact Dedicated Type," which can be converted in 3 minutes without flatness correction due to its quick-change glass design. Please feel free to contact us if you have any inquiries. 【Product Lineup】 ■E3000 Color Dedicated Type ■L1800 Color General-Purpose Machine - Octagonal Machine ■E8000 Color Compact Dedicated Type *For more details, please download the PDF or feel free to contact us.

  • Visual Inspection Equipment
  • Defect Inspection Equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Press part defect inspection device

Press part defect inspection device

It has flexible characteristics and can adapt to various types of pressed parts.

Our company utilizes a "Press Parts Defect Inspection Device" that combines advanced vision technology and artificial intelligence algorithms for processing and analysis, enabling efficient, accurate, and comprehensive inspections. Thanks to the positioning and posture of the camera used for image capture, as well as the autofocus control algorithm, it is possible to conduct appearance inspections of press parts with varying sizes, different surface conditions, and numerous types of defects. Additionally, our high-speed imaging technology processes 30 images per second, allowing for online inspection of the presence or absence of defects greater than 1mm at a conveyor speed of 600mm/s. 【Product Features】 ■ Strong compatibility and convenience, high stability ■ Self-diagnostic function of the system ■ Accuracy in triggering image capture ■ Remote data monitoring *For more details, please download the PDF or feel free to contact us.

  • Defect Inspection Equipment
  • Defect Inspection Equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Internal Defects in Materials Inspection Device 3D V-ROX

Internal Defects in Materials Inspection Device 3D V-ROX

Rapid and easy identification of internal defects using active thermography inspection method.

This is a device that adds heat to the measurement target and confirms changes in thermal conductivity using an infrared camera. By integrating the heat source and the camera, it has become compact and lightweight, making it suitable for field services and installation on robots. It can determine defects in CFRP and honeycomb internal structures without using X-ray inspection.

  • Voidsy_mro.jpg
  • 画像2.jpg
  • 画像1.jpg
  • 画像8.jpg
  • 画像9.jpg
  • 画像16.jpg
  • 画像4.jpg
  • 画像5.jpg
  • 画像11.jpg
  • Defect Inspection Equipment
  • Defect Inspection Equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Offline inspection device "MICRO ACE series"

Offline inspection device "MICRO ACE series"

Customizable! A lineup of offline inspection devices capable of high-resolution testing.

The "MICRO ACE Series" is an offline inspection device handled by Ayaha Engineering. The "OMI-UL," which can achieve a resolution of 0.7μ to ultra-high resolution inspection, can be linked with 3D measuring instruments and allows for the measurement of defect depth with the push of a button from the inspection map. Additionally, we offer a compact type "OMI-SP" and a simplified inspection model "OMI-FE" that can perform inspections at 10 to 100μ. 【Features】 <OMI-UL> ■ Capable of ultra-high resolution inspection from 0.7μ ■ Wide depth of field allows for full shape imaging of defects without variation due to focus ■ A rich combination of optical systems and defect type discrimination through image processing ■ Defect analysis possible with 3D measurement using a laser microscope (optional) ■ Active in research and development scenes for advanced materials such as displays, electronic materials, and batteries *For more details, please contact us.

  • OMI-SP.jpg
  • 卓上FE.jpg
  • Other inspection equipment and devices
  • Visual Inspection Equipment
  • Other appearance and image inspection equipment
  • Defect Inspection Equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Murabiyuwaa

Murabiyuwaa

It is possible to automatically detect and visualize even the smallest changes at the nanoscale without missing them!

The "Murabiyuwa Series" changes the common sense of inspection. It is a new sensation scope that allows you to confirm "invisible and hard-to-see" defects in a "clear and vivid" manner. It enables visual inspection and evaluation of nano-sized fine polishing marks, orange peel, scratches remaining on the surfaces of glass, crystal, sapphire, and fine grain patterns and crystal defects inside, leading to improved management of surface roughness, setting of polishing conditions, and significantly enhancing yield after deposition.

  • ムラビューワー.png
  • ムラビューワー２.png
  • Visual Inspection Equipment
  • Defect Inspection Equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Glass edge defect inspection device *Inspection of the front, back, and sides is possible with one camera.

Glass edge defect inspection device *Inspection of the front, back, and sides is possible with one camera.

Easily installable on existing lines! A glass edge defect inspection device that uses a special prism to inspect the surface, back, and sides of glass with a single camera.

This is a system for detecting edge cracks, grinding width, corner cuts, oriflat cuts, and chipping defects on glass substrates before cleaning. We offer a low-cost glass edge defect inspection machine. 【Features】 ■ Can be easily installed in existing lines with minimal space. ■ Capable of inspection at a speed of 800mm/sec. ■ Creates and saves inspection result LOG data and defect images in real-time. ■ LOG data can also be saved as CSV format files. *For more details, please download the catalog or contact us directly.

  • Defect Inspection Equipment
  • Defect Inspection Equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
High-speed defect inspection device for non-woven fabric

High-speed defect inspection device for non-woven fabric

Hidden defects are clearly visible! Non-woven fabric defect inspection device capable of detecting even light colors such as yellow.

The Media Research Institute's "High-Speed Defect Inspection Device for Non-Woven Fabrics" is the ideal defect inspection device for those struggling with issues such as fluff, shots, and wind cotton. Thanks to the multi-channel optical system's technology for capturing multiple images of defects, the integration of multiple optical systems emphasizes the contrast between defects and the base material. With a high-speed camera, it can also accommodate high-speed lines, and its technology allows for the detection of light colors such as yellow while maintaining high-speed performance for color detection. 【Features】 ■ Emphasizes the contrast between defects and the base material through the integration of multiple optical systems ■ Accommodates high-speed lines with a high-speed camera ■ Detects light colors such as yellow ■ Effective for colored non-woven fabrics such as black ■ Clearly reveals defects hidden in the base material *For more details, please refer to the PDF document or feel free to contact us.

  • Defect Inspection Equipment
  • Other inspection equipment and devices
  • Defect Inspection Equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Cylindrical inner surface defect inspection device

Cylindrical inner surface defect inspection device

Hole inspection [Automating nest hole, defects, and visual inspection!] Proposed by Nidec Tosok, a manufacturer of automotive parts and precision measuring instruments.

Automatically inspect the grinding surfaces of cast processed products for voids and scratches non-contactly, allowing for quantitative measurement of the size of the voids.

  • Defect Inspection Equipment
  • Defect Inspection Equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Wafer surface defect inspection device with review function

Wafer surface defect inspection device with review function

Equipped with a review microscope! Defects detected can be observed in real-time with the microscope.

By irradiating a high-power laser onto a wafer on a rotating stage, the entire surface is inspected at high speed, allowing for the detection of minute defects. By combining multiple channels such as scattering, reflection, and phase shift, defect detection suitable for various applications can be achieved, enabling discrimination by defect type such as unevenness. ■ Features of the device - High-speed inspection (approximately 181 seconds/12 inches) - Equipped with a review microscope - The microscope can be selected as either a laser microscope or a differential interference microscope - High-precision scribing using the microscope for analysis with SEM, etc. - Optional edge inspection functionality is available

  • Semiconductor inspection/test equipment
  • Defect Inspection Equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Microscopic wafer surface defect inspection device

Microscopic wafer surface defect inspection device

High-precision inspection equipment compatible with transparent materials.

This is a surface defect inspection device equipped with a differential interference microscope, applicable to transparent materials. It is capable of outputting defect maps through comprehensive inspections and allows for microscopic observation of detected defects. ■ Features of the device - Defect extraction and discrimination functions using proprietary image processing technology - High-precision marking while observing defects - Enables observation and creation of defect albums based on defect coordinates for wafers inspected by other devices - Development of a crystal defect detection function is underway

  • Semiconductor inspection/test equipment
  • Defect Inspection Equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Chip element defect inspection machine

Chip element defect inspection machine

It is a high-precision XYZ auto stage.

Automatically inspects chip element defects on wafers. The system controls a microscope color camera and auto stage to automatically identify defects at the chip element level. For more details, please download and view the catalog.

  • Other microscopes
  • Other inspection equipment and devices
  • Defect Inspection Equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Cylindrical inner surface defect inspection device

Cylindrical inner surface defect inspection device

Non-contact inspection of casting processed products for surface defects such as pits and scratches is possible.

This is a device for inspecting grinding processing surface defects and scratches on cast metal products, which automatically conducts non-contact inspections of the entire inner surface of the cylinder and can record the location of defects. It helps improve productivity and quality without damaging the workpiece itself.

  • Recorders
  • Defect Inspection Equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Edge Defect Inspection Device "RXW Series"

Edge Defect Inspection Device "RXW Series"

Unique laser application technology and sensor/image processing technology! Equipment dedicated to silicon wafers.

The "RXW Series" is a dedicated edge defect inspection device for silicon wafers that utilizes unique laser application technology along with sensor and image processing technology. It meets the diverse inspection, dimensional measurement, and automatic sorting requirements for edge proximity areas demanded in both wafer manufacturing and device manufacturing processes. We offer models such as the "RXW-1200D" and "RXW-1200F" that are compatible with device manufacturing processes. 【Features】 <RXW-1200D> ■ Full circumference image acquisition and ADC functionality using a laser sensor ■ Dark field switching function that enables high-sensitivity inspection ■ Border measurement function after EBR ■ Inspection and measurement after edge trimming, bonding, and sintering in CIS/TSV processes ■ ADR function with a high-magnification AF color camera *For more details, please refer to the PDF document or feel free to contact us.

  • Other inspection equipment and devices
  • Defect Inspection Equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Defect Detection for Semiconductors using Cheetah EVO

Defect Detection for Semiconductors using Cheetah EVO

Support for program operation, automation of semiconductor inspection, and stabilization of quality.

In the semiconductor industry, detecting minute defects in the manufacturing process is essential to ensure product quality and reliability. Especially as devices become smaller and more densely packed, tiny defects that are difficult to detect through visual inspection can significantly impact product performance. The Cheetah EVO provides high-precision X-ray inspection technology to address these challenges. 【 Application Scenarios 】 ● Internal defect inspection of semiconductor chips ● Defect analysis of packaging ● Inspection of bonding failures in mounted substrates 【 Benefits of Implementation 】 ● Improved yield through early detection of defects ● Labor reduction through automation of the inspection process ● Stable supply of high-quality products

  • スライド2.PNG
  • スライド3.PNG
  • スライド4.PNG
  • スライド5.PNG
  • スライド6.PNG
  • スライド7.PNG
  • 2.jpg
  • 7.jpg
  • X-ray inspection equipment
  • Defect Inspection Equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
[Image Processing Related] OEM Product Digital Defect Inspection Device

[Image Processing Related] OEM Product Digital Defect Inspection Device

We uphold a commitment to "quality first" and confidently and responsibly deliver our products.

All planning proposals, order-taking, contract manufacturing, and the development and production of OEM products are fundamentally based on wisdom, passion, and originality. The work of Nichio Electric Co., Ltd. encompasses a wide range of activities, including the design, manufacturing, and sales of various devices, software development, and system design. We have obtained international certifications ISO 9001:2015 and ISO 14001:2015, establishing a globally recognized management system. We operate an effective Integrated Management System (IMS) and implement step-by-step check management based on policy documents (design policy documents, manufacturing policy documents, countermeasure policy documents, etc.) from order to delivery, focusing on improving and stabilizing quality, as well as designing and manufacturing environmentally considerate products as a company-wide theme. With foresight to predict market trends, we propose plans for hardware or software and respond to various requests for product development by leveraging our advanced technological capabilities. This unwavering spirit is supported by the energy and originality of our staff's ideas.

  • Analytical Equipment and Devices
  • Defect Inspection Equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Related Categories of Defect Inspection Equipment

IPROS Services
COPYRIGHT © 2001-2026 IPROS CORPORATION ALL RIGHTS RESERVED.